Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Birgitta Böckeler, Distinguished Engineer at ...

The complexity of system-on-chip (SoC) designs continues to grow, so the corresponding design-for-test (DFT) logic required for manufacturing has become more advanced. Design teams are challenged by ...

The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a “test re-use” strategy ...

Failures have been present in electronic products since the days of vacuum tubes, and despite enormous development and production improvements, no manufacturing technique can guarantee a 100% ...

For years, engineers have neglected the "design" part of design-for-test. DFT shouldn't be an afterthought and test engineers can take on some of the task. Design for Testability (DFT) is comprised of ...

JTAG has its place but it is not by any means the total solution. Boundary scan, as standardized by IEEE 1149.1 and commonly referred to as JTAG, has truly revolutionized the testability of circuit ...

Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these techniques ...

The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a "test re-use" strategy ...