Electrostatic Force Microscopy (EFM) and dielectric characterisation have emerged as pivotal techniques in the exploration of nanoscale phenomena, enabling researchers to probe the electrical ...

New hybrid nano-microscope by KRISS allows simultaneous measurement of optical and electrical properties. Expected to accelerate nano-scale research on advanced equipment and materials such as bilayer ...

Definition: Kelvin Probe Force Microscopy (KPFM), also known as Surface Potential Microscopy, is a cutting-edge scanning probe microscopy technique that measures the surface potential of materials at ...

A team of researchers from the Korea Research Institute of Standards and Science (KRISS) has created a hybrid nano-microscope that can measure a variety of nano-material properties simultaneously.

Researchers have proposed a new method to form an electron lens that will help reduce installation costs for electron microscopes with atomic resolution, proliferating their use. Instead of the ...

Scanning probe microscopes produce images based not on light, but on electron density and charge. Scientists are producing incredible images of tinyness heretofore visible only by means of an artist's ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure AFSEM is an atomic force microscope (AFM ...

(Nanowerk News) The Korea Research Institute of Standards and Science (KRISS) has developed a hybrid nano-microscope capable of simultaneously measuring various nanomaterial properties. This ...