Utilizing Secondary Ion Mass Spectrometry (SIMS) for in-line metrology is a newly emerging method of process control that requires contamination-free measurements, enabling SIMS on product wafers.

Note: This video is designed to help the teacher better understand the lesson and is NOT intended to be shown to students. It includes observations and conclusions that students are meant to make on ...

Pore-forming proteins are found throughout nature. In humans, they play key roles in immune defense, while in bacteria they ...

Do you ever wonder why it feels so good to be outdoors, in the woods, on the water and especially around waterfalls? Negative ions might be the answer. Negative air ions are actually positive ...

Lipid fragmentation is class and ion mode specific. For example fragment spectra of phosphocholines yield mainly the characteristic head group fragment (184.07 m/z). MS/MS data acquired in negative ...