In New test points slash ATPG test pattern count, I described a new type of test point technology used with scan compression for device testing. The key benefit of using test points with embedded ...

Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...

Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...

The importance of properly integrating test points into a PCB design. Test-point deployment considerations. When it comes to creating a modern electronic design, we live in both the best and the worst ...

The Hechinger Report covers one topic: education. Sign up for our newsletters to have stories delivered to your inbox. Consider becoming a member to support our nonprofit journalism. In education ...

The Hechinger Report covers one topic: education. Sign up for our newsletters to have stories delivered to your inbox. Consider becoming a member to support our nonprofit journalism. Wesleyan ...

In the upcoming NFPA 70E 2024 Edition, the inclusion of the phrase “at each point of work” and the relationship to absence of voltage testing has prompted questions regarding the use of Permanent ...

We’ve said it before: building one-offs is different from building at scale. Even on a small scale. There was a time when it was rare for a hobbyist to produce more than one of anything, but these ...