[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...

Forbes contributors publish independent expert analyses and insights. Craig S. Smith, Eye on AI host and former NYT writer, covers AI. Software development is a creative endeavor, but it can be filled ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.