Through a novel combination of machine learning and atomic force microscopy, researchers in China have unveiled the molecular ...

Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...

Atomic force microscopy (AFM) has emerged as a pivotal technique in biological research, offering unparalleled spatial resolution and force sensitivity to visualise and quantify the nanoscale ...

AILA can now manage this instrument, make real-time decisions during experiments, and generate results independently.

Atomic force microscopy (AFM) and infrared (IR) spectroscopy have emerged as complementary techniques that enable the precise characterisation of materials at the nanoscale. AFM provides ...

A new technical paper titled “Probing the Nanoscale Onset of Plasticity in Electroplated Copper for Hybrid Bonding Structures via Multimodal Atomic Force Microscopy” was published by researchers at ...

We know that the process of viral uptake into cells begins with interactions between proteins hemagglutinin and neuraminidase ...

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...